Kewell MX300C-1500 Semiconductor Thermal Characteristics Test System

Precision:

Constant temp. plate 1:

Temp. control precision: ±0.5℃

Temp. control range: 15~80℃

Constant temp. plate 2:

Stability: ±0.01℃

Temp. control range: -35~200℃

Voltage drop measurement: ±50μV

Tj measurement: ±2℃

Temp. measurement of cold plate & case: ±2℃

Gate current detection: 0.2nA-100uA; Resolution: 25pA

Capacity:

Rth/Zth/K Curve: 1 sample per single test

Power cycling (Unit: Second/Minute): 12 samples per single test

The K Curve Test:

Test current: Range: 0~3A; Precision: ≤0.1%+5mA; Resolution: 0.1mA

Constant temp. system: Temp. range: -35~200℃; Stability: ±0.01℃ (Depend on the equipment.)

Rth/Zth Test:

Tj test: Sampling rate: 1MHz; Precision: 2℃; Resolution: 0.1℃

Tc test: Sampling rate: 1MHz; Precision: 2℃; Resolution: 0.1℃

Fast turnoff: Sample Im can be removed within 1μs.

Zthjc/Zthja tests: Available

Display of integral/differential structure function curve: Available

Power Cycling Test (Unit: Second):

Power supply:

Output capacity>1800A

Current precision: ±0.1%set+0.4%FS

Tj test: Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃

Tc test: Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃

Typical conditions: 0.5s<tcycle<10s; Tjmax=150℃; ΔTjmax=60K; 130,000 cycles

Ageing mode: Constant current; Constant Tjmax/ΔTjmax; Constant power P

Data recording: IH; ton; toff; Tjmax; ΔTj; Tjmin; Tcoolant; Coolant flow F; Cold plate temp. THS

Power Cycling Test (Unit: Minute):

Power supply:

Output capacity: >1800A/10V

Current precision: ±0.1%set+0.4%FS

Tj test: Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃

Tc test: Sampling rate: 10KHz; Precision: 2℃; Resolution: 0.1℃

Typical conditions: 2min<tcycle<6min; TCmin=25℃; ΔTjmax=80K; 2,000~5,000 cycles

Ageing mode: Constant current; Constant Tjmax/ΔTjmax; Constant power P

Data recording: IH; ton; toff; Tjmax; ΔTj; Tjmin; Tcoolant; Coolant flow F; Cold plate temp. THS

Detail

Datasheet


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